Pattern Classification
Pattern Classification
Duda, Richard O.; Stork, David G.; Hart, Peter E.
John Wiley & Sons Inc
11/2000
688
Dura
Inglês
9780471056690
15 a 20 dias
1200
Maximum-Likelihood and Bayesian Parameter Estimation.
Nonparametric Techniques.
Linear Discriminant Functions.
Multilayer Neural Networks.
Stochastic Methods.
Nonmetric Methods.
Algorithm-Independent Machine Learning.
Unsupervised Learning and Clustering.
Appendix.
Index.
Maximum-Likelihood and Bayesian Parameter Estimation.
Nonparametric Techniques.
Linear Discriminant Functions.
Multilayer Neural Networks.
Stochastic Methods.
Nonmetric Methods.
Algorithm-Independent Machine Learning.
Unsupervised Learning and Clustering.
Appendix.
Index.