Surface Analysis
Surface Analysis
The Principal Techniques
John Wiley and Sons Ltd
07/1997
474
Mole
Inglês
9780471972921
680
Descrição não disponível.
Vacuum Technology for Applied Surface Science (R. Wilson). Electron Spectroscopy for Chemical Analysis (B. Ratner & D. Castner). Auger Electron Spectroscopy (H. Mathieu). Secondary Ion Mass Spectroscopy-the Surface Mass Spectrometry (J. Vickerman & A. Swift). Low-Energy Ion Scattering and Rutherford Backscattering (E. Taglauer). Vibrational Spectroscopy from Surfaces (M. Pemble). Surface Structure Determination by Interference Techniques (W. Flavell). Scanning Tunnelling Microscopy and Atomic Force Microscopy (G. Leggett). Index.
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Vacuum Technology for Applied Surface Science (R. Wilson). Electron Spectroscopy for Chemical Analysis (B. Ratner & D. Castner). Auger Electron Spectroscopy (H. Mathieu). Secondary Ion Mass Spectroscopy-the Surface Mass Spectrometry (J. Vickerman & A. Swift). Low-Energy Ion Scattering and Rutherford Backscattering (E. Taglauer). Vibrational Spectroscopy from Surfaces (M. Pemble). Surface Structure Determination by Interference Techniques (W. Flavell). Scanning Tunnelling Microscopy and Atomic Force Microscopy (G. Leggett). Index.
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
